research of oral microscope-assisted implant surface decontamination.

抄録

OBJECTIVES: To investigate the effect of oral microscope-assisted surface decontamination on implants .

METHODS: Twelve implants that fell off because of severe peri-implantitis were collected, and decontamination was carried out on the surfaces of implants through curetting, ultrasound, titanium brushing, and sandblasting at 1×, 8×, or 12.8× magnifications. The number and sizes of residues on the implants' surfaces after decontamination were determined, and the decontamination effect was analyzed according to the thread spacing in the different parts of the thread.

RESULTS: 1) The 8× and 12.8× groups scored lower for implant surface residues than the 1× group (<0.000 1), and the 12.8× group scored lower than the 8× group (<0.001); 2) no difference in residue score was found between the wide and narrow thread pitch (>0.05), and the 8× and 12.8× groups had lower scores than the 1× group (<0.001); 3) the lowest number of contaminants was observed at the tip of the thread, whereas the highest was observed below the thread, and the difference was significant (<0.001). However, the thread pitch had no effect on the number of contaminants in different areas (>0.05); 4) the residue scores of the 8× and 12.8× groups were lower than those of the 1× group at the thread tip and above, sag, and below the thread of the implants (<0.05).

CONCLUSIONS: Residues on the surfaces of contaminated implants can be effectively removed by using an oral microscope. After decontamination, the residues of pollutants were mainly concentrated below the thread of the implants, and the thread pitch of the implants had no significant effect on the residues.

: 探讨体外采用口腔显微镜辅助种植体表面去污的效果。: 收集因重度种植体周围炎而脱落的12颗离体种植体，按照“刮治、超声、钛刷、喷砂”的流程，分别在裸眼（1倍）、8倍、12.8倍显微镜放大倍数下对植体表面进行去污，测量去污后植体表面螺纹尖端、上方、凹陷区和下方4个位置残留物的位点数及大小；根据螺纹间距和螺纹不同部位对去污效果做进一步分析。: 1）显微镜8倍、12.8倍组植体表面残留物评分均低于裸眼（<0.000 1），12.8倍组的评分低于8倍组（<0.001）；2）宽、窄螺纹间距之间残留物评分无差别（>0.05），8倍和12.8倍组的残留物评分均低于裸眼组（<0.001）；3）螺纹尖端污染物位点数最少，螺纹下方残留污染物最多，差异有统计学意义（<0.001），但螺纹宽度对不同部位残留的污染物位点数没有影响（>0.05）；4）8倍、12.8倍组在螺纹尖端、上方、凹陷区和下方四个位置的残留物评分均低于裸眼组（<0.05）。: 借助口腔显微镜可更为有效去除污染植体表面的残留物，去污后污染物的残留主要集中在植体螺纹下方，植体螺纹宽度对污染物的残留无显著的影响。.

OBJECTIVE: To investigate the effect of oral microscope-assisted surface decontamination on implants .

METHODS: Twelve implants that fell off because of severe peri-implantitis were collected, and decontamination was carried out on the surfaces of implants through curetting, ultrasound, titanium brushing, and sandblasting at 1×, 8×, or 12.8× magnifications. The number and sizes of residues on the implants' surfaces after decontamination were determined, and the decontamination effect was analyzed according to the thread spacing in the different parts of the thread.

RESULTS: 1) The 8× and 12.8× groups scored lower for implant surface residues than the 1× group (<0.000 1), and the 12.8× group scored lower than the 8× group (<0.001); 2) no difference in residue score was found between the wide and narrow thread pitch (>0.05), and the 8× and 12.8× groups had lower scores than the 1× group (<0.001); 3) the lowest number of contaminants was observed at the tip of the thread, whereas the highest was observed below the thread, and the difference was significant (<0.001). However, the thread pitch had no effect on the number of contaminants in different areas (>0.05); 4) the residue scores of the 8× and 12.8× groups were lower than those of the 1× group at the thread tip and above, sag, and below the thread of the implants (<0.05).

CONCLUSION: Residues on the surfaces of contaminated implants can be effectively removed by using an oral microscope. After decontamination, the residues of pollutants were mainly concentrated below the thread of the implants, and the thread pitch of the implants had no significant effect on the residues.